A cost-effective solution for hotspot detection and thermal fault localization using liquid crystal technology.
ARSIL
High-performance solid immersion lens technology enabling sub-wavelength resolution for advanced node semiconductor analysis.
Auricool
A patented cooling system for dynamic laser technique and laser waveform probing, capable of handling >200W heat flux with proprietary thermal interface.
Thermal Microscopy (THM)
Comprehensive thermal imaging and analysis solution for identifying hotspots and thermal anomalies in semiconductor devices.
Scanning Optical Microscopy (SOM)
Advanced optical microscopy solution providing high-resolution imaging capabilities for semiconductor analysis and inspection.
Photon Emission Microscopy (PEM)
Advanced emission microscopy technology for detecting weak light emissions from semiconductor devices, enabling precise fault localization.
Laser Timing Probe (LTP)
Revolutionary instrument that measures waveforms at any selected point inside a semiconductor device without physical contact, using precision laser technology.
SEMICAPS 5000
An inverted direct tester-docked system designed for wafer probing applications with 300mm wafer handling capability.
SEMICAPS 4000
A versatile upright microscope system that functions both as a standalone analytical tool and a tester dockable solution.
SEMICAPS 3000
An inverted microscope system that is tester dockable, easily moved from tester to tester with custom docking for all ATE platforms.