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With decades of expertise rooted in SEMICAPS' origins, we design and manufacture advanced tools for:

  • IC design-debug analysis
  • Yield improvement for early wafers
  • Failure analysis of customer returns
  • Packaging and advanced packaging defects
  • Applications across research, cybersecurity, aerospace, and more
View Credentials

About SEMICAPS Pioneering Semiconductor Fault Localization Technology

Innovation Legacy

SEMICAPS was founded in 1989 by Prof Jacob Phang as the first National University of Singapore (NUS) spin-off. SEMICAPS specializes in equipment manufacturing and techniques for electrical inspection, testing and failure analysis (FA) of semiconductor devices. SEMICAPS is an acronym for Scanning Electron Microscope Image Collection And Capturing System.

SEMICAPS builds machines for Fault Isolation (FI), Quality Reliability (QR) and Defect Characterization, and has developed and commercialized many World's Firsts with a proud history of strong R&D and technical capability:

  • Design-debug analysis of new integrated circuits (ICs)
  • Yield improvement analysis for early semiconductor wafers
  • Failure analysis of customer returns
  • Packaging and advanced packaging defects
  • Applications in research institutes, cyber security, space, higher learning, government, and more

35+
Years of Innovation
100+
Global Install Base
30 Expert Staff
Singapore - USA - Taiwan - China - SEA
9 Patents
Technology Innovation
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🔬 Technology Leadership

Our Credentials Industry-Leading Innovation & Patents

🏆

President's Technology Award

2009

Singapore's Highest Technology Honor

Awarded the President's Technology Award 2009 - Singapore's most prestigious recognition for outstanding achievements in science and technology innovation

ISTFA Best Paper 2000, 2001, 2008
Kyoto Award 1996
50%

Top 20 Semiconductor Companies

Half of the world's top 20 semiconductor companies use SEMICAPS equipment

14nm

Advanced Node Qualification

Laser scan microscope qualified for 14nm products by large manufacturer

5K+

Direct-Dock Innovation

Pioneered direct-dock analytical wafer prober with >5000 pin capability

NUS

Research Collaboration

Ongoing collaboration with National University of Singapore for fundamental technology development

🌟 Trusted Worldwide

Our Customers Leading Semiconductor Companies Trust SEMICAPS

Industry giants who rely on SEMICAPS for failure analysis and design-debug

50%+
Top 20 Semiconductor Companies
Over half of the world's top 20 semiconductor companies use SEMICAPS equipment
🏆 Innovation Journey

Company Milestones Three Decades of Breakthrough Innovation

1989
Foundation 1989
SEMICAPS began operations in 1989 when lecturers from the National University of Singapore (NUS) founded the holding company to commercialise products based on technologies that were developed at the Centre for Integrated Circuit Failure Analysis and Reliability (CICFAR).
1990s
Innovation 1990s
  • First to digitize SEM image into IBM PC
  • First to acquire an ultra high resolution 4k x 4k SEM image
  • Imaging system received IES Gold award
  • Fast Hardware Aquisition System for high resolution 1k x 1k SEM images
  • SEMICAPS Genie for Windows TM was launched
  • Cathodoluminescent System launched
  • 4th IES Innovators Award
  • SEMICAPS Spectroscopic PEM and backside PEM introduced
  • SEMICAPS SOM 1005 was developed for Advanced Micro Devices
2000s
Achievement 2000s
  • SEMICAPS Scanning Optical Microscope (SOM) was launched
  • Awarded ISTFA 2001 Best Paper
  • SEMICAPS 2000, the first upright tester docked SOM
  • First to introduce use of InGaAs camera for backside emission systems
  • SEMICAPS 3000 inverted tester docked system launched
  • Patented DREM launced
  • First to introduce inverted analytical and tested docked system
  • Patented Pulsed Laser Induced technique introduced
  • First commercial ARSIL for backside laser analysis
  • Introduced SEMICAPS LTP, Laser Timing Probe system
  • Awarded IPFA 2008 Best Paper Award
  • SEMICAPS team awarded Singapore's President's Technology Award
  • SEMICAPS 5000 Analytical Wafer Prober launched
  • Patented VBA
2010s
Revolution 2010s
  • ARSIL pitch resolution of below 240nm
  • Introduced Centric Solid Immersion Lens (C-SIL) compatible with 800 um silicon
  • SEMICAPS Auricool, a heat extraction system to successfully cool a 200W device
  • Automated method for ondie logic analysis for design debug and scan chain analysis
  • ARSIL achieved pitch resolution of below 200nm
  • SEMICAPS SOM 5000 Direct Probe Interface
  • SEMICAPS celebrates 25th Anniversary
  • Collaborates with Intel Launches, Knights Corner, Knights Landing and Skylake Server Chips
  • 14nm nodes debugged on SEMICAPS LTP3000 with Patented Auricool for hi speed testing
  • Successfully analysed a 7nm node test chip from NVIDEA with waveforms using NIR resolving 75nm line width
  • SEMICAPS SOM 1500 Large Sample Upright Analysitcal Instrument launched. Dual Column - Thermal and NIR. 800mm by 600mm stage
  • SEMICAPS THM 1100 MWIR (2um-5um wavelength)
  • SEMICAPS MWIR Thermal Lock-in Capability
  • Highest Resolution Silicon 3.3NA ARSIL
2020s
Evolution 2020s
  • ARSIL resolves a 142nm pitch on Intel Skylake Xeon E3 Processor
  • SEMICAPS THM 1100 next gen enhanced lock in capability to 10MHz and over and phase detection
  • Develops "Electrical Metrology" data collecting automation for wafer probing with a local Fab
  • SEMICALS LTP3300 Probing and working with strategic partners in TW and USA on 3nm tech node debug analysis
  • First to offer InGaAs and Extended InGaAs for longer wavelength photon emissions (900-2200nm)
  • SEMICAPS SOM1100-HV 532nm green laser for probing on III-V semiconductor compound devices such as SiC and GaN