Semiconductor Chip

SEMICAPS

World's leading company in high resolution infra-red laser scanning microscopes for semiconductor design-debug analysis, yield improvement, and failure analysis. Trusted by Samsung, Intel, TSMC, AMD, and other top semiconductor manufacturers.

Products & Solutions

Explore our comprehensive range of world-leading fault localization microscopes designed for semiconductor design-debug, yield improvement, and failure analysis.
SEMICAPS Semiconductor Analysis System

SEMICAPS 1100

Upright Analytical

Standalone lab based upright analytical microscope system for comprehensive semiconductor analysis.

0.5 μm Repeatability ARSIL Compatible

SEMICAPS 3000

Tester Dockable

Inverted microscope system that is tester dockable, easily moved from tester to tester.

ATE Docking Portable Design

SEMICAPS 4000

Dual Configuration

Inverted system that is both analytical and tester dockable with 300mm wafer stage.

300mm Wafer Dual Mode

SEMICAPS 5000

Direct Tester-Docked

Full analytical direct tester-docked wafer prober system with complete integration.

8 GHz Speed 10,000+ Pins
Advanced analysis techniques for comprehensive fault localization and semiconductor characterization.
Electrical Analysis Solution

LTP

Laser Timing Probe

High-speed timing analysis for semiconductor circuit debugging and characterization.

Non-Contact Analysis 12 GHz Bandwidth

PEM

Photon Emission Microscopy

Advanced photon emission detection for fault localization and reliability analysis.

High Sensitivity Real-time Detection

SOM

Scanning Optical Microscopy

Multi-laser system for the active localization of integrated circuit defects

Active Localization Dynamic Tester-Based

THM

Thermal Microscopy

Precise thermal analysis and mapping for semiconductor device characterization.

Temperature Mapping Heat Distribution
Advanced accessories and enhancement solutions for optimal semiconductor analysis performance.
Auricool Accessory

Auricool

Advanced Cooling System

High-capacity cooling system for optimal device performance during extended analysis sessions.

200W Heat Capacity Temperature Control

ARSIL

Solid Immersion Lens

Advanced solid immersion lens technology for enhanced resolution and analysis capabilities.

3.3 NA Resolution Enhanced Precision

Liquid Crystal

Hot Spot Locator

Cost effective method to locate hot spot

Non-Destructive Hot Spot Detection

Events