Take a Closer Look at Electrically-Enhanced Lada: Setup

S.H. Goh, B.L. Yeoh, D.F. You, Y.H. Chan, Zhao Lin, Jeffrey Lam, C.M. Chua  Year Published: 2016

Resolution and Sensitivity Enhancements of Scanning Optical Microscopy Techniques for Integrated Circuit Failure Analysis

JCH Phang, SH Goh, ACT Quah, CM Chua, LS Koh, SH Tan, WP Chua  Year Published: 2009

Design Considerations for Refractive Solid Immersion Lens: Application to Subsurface Integrated Circuit Fault Localization Using Laser Induced Techniques

S.H. Goh, C.J.R Sheppard, A.C.T. Quah, C.M. Chua, L.S. Koh, J.C.H. Phang  Year Published: 2009

Combining Refractive Solid Immersion Lens and Pulsed Laser Induced Techniques for Effective Defect Localization on Microprocessors

A.C.T. Quah, S.H. Goh, V.K. Ravikumar, S.L. Phoa, V. Narang, J.M. Chin, C.M. Chua, J.C.H. Phang  Year Published: 2008

Applications of Scanning Near-Field Photon Emission Microscopy

DV Isakov, BWM Tan, JCH Phang, YC Yeo  Year Published: 2008

Near-field Detection of Photon Emission from Silicon with 30 nm Spatial Resolution

Isakov, A.A.B. Tio, T. Geinzer, J.C.H. Phang, Y. Zhang, L.J. Balk  Year Published: 2008

A Review of Near Infrared Photon Emission Microscopy and Spectroscopy

JCH Phang, DSH Chan, SL Tan, WB Len, KH Yim, LS Koh, CM Chua, LJ Balk  Year Published: 2005

A Review of Laser Induced Techniques for Microelectronic Failure Analysis

JCH Phang, DSH Chan, M Palaniappan, JM Chin, B Davis, M Bruce. J Wilcox, G Gilfeather, CM Chua, LS Koh, HY Ng, SH Tan  Year Published: 2004


US Patent No.: US 9,917,034 B2

Method and Apparatus for Cooling A Semicondutor Device

US Patent No.: US 9,714,978 B2

At-Speed Integrated Circuit Testing Using Through Silicon In-Circuit Logic Analysis

US Patent No.: US 8,891,240 B2

Apparatus and Method for Cooling A Semiconductor Device

US Patent No.: US 8,436,631 B2

Wafer Stage

US Patent No.: US 8,278,959 B2

Method and System for Measuring Laser Induced Phenomena Changes in a Semiconductor Device

US Patent No.: US 8,072,699 B2

Solid Immersion Lens Optics Assembly

US Patent No.: US 7,623,982 B2

Method of Testing an Electrical Circuit and Apparatus Thereof

US Patent No.: US 7,456,032 B2

Method and System for Measuring Laser Induced Phenomena Changes in a Semiconductor Device

US Patent No.: US 6,897,664 B1

Laser Beam Induced Phenomena Detection