PAPERS
Take a Closer Look at Electrically-Enhanced Lada: Setup
S.H. Goh, B.L. Yeoh, D.F. You, Y.H. Chan, Zhao Lin, Jeffrey Lam, C.M. Chua Year Published: 2016
Resolution and Sensitivity Enhancements of Scanning Optical Microscopy Techniques for Integrated Circuit Failure Analysis
JCH Phang, SH Goh, ACT Quah, CM Chua, LS Koh, SH Tan, WP Chua Year Published: 2009
Design Considerations for Refractive Solid Immersion Lens: Application to Subsurface Integrated Circuit Fault Localization Using Laser Induced Techniques
S.H. Goh, C.J.R Sheppard, A.C.T. Quah, C.M. Chua, L.S. Koh, J.C.H. Phang Year Published: 2009
Combining Refractive Solid Immersion Lens and Pulsed Laser Induced Techniques for Effective Defect Localization on Microprocessors
A.C.T. Quah, S.H. Goh, V.K. Ravikumar, S.L. Phoa, V. Narang, J.M. Chin, C.M. Chua, J.C.H. Phang Year Published: 2008
Applications of Scanning Near-Field Photon Emission Microscopy
DV Isakov, BWM Tan, JCH Phang, YC Yeo Year Published: 2008
Near-field Detection of Photon Emission from Silicon with 30 nm Spatial Resolution
Isakov, A.A.B. Tio, T. Geinzer, J.C.H. Phang, Y. Zhang, L.J. Balk Year Published: 2008
A Review of Near Infrared Photon Emission Microscopy and Spectroscopy
JCH Phang, DSH Chan, SL Tan, WB Len, KH Yim, LS Koh, CM Chua, LJ Balk Year Published: 2005
A Review of Laser Induced Techniques for Microelectronic Failure Analysis
JCH Phang, DSH Chan, M Palaniappan, JM Chin, B Davis, M Bruce. J Wilcox, G Gilfeather, CM Chua, LS Koh, HY Ng, SH Tan Year Published: 2004
PATENTS
US Patent No.: US 9,714,978 B2
At-Speed Integrated Circuit Testing Using Through Silicon In-Circuit Logic Analysis
US Patent No.: US 8,278,959 B2
Method and System for Measuring Laser Induced Phenomena Changes in a Semiconductor Device
US Patent No.: US 7,623,982 B2
Method of Testing an Electrical Circuit and Apparatus Thereof
US Patent No.: US 7,456,032 B2
Method and System for Measuring Laser Induced Phenomena Changes in a Semiconductor Device