Patents US Patent No.: US 9,917,034 B2Method and Apparatus for Cooling A Semiconductor Device US Patent No.: US 9,714,978 B2At-Speed Integrated Circuit Testing Using Through Silicon In-Circuit Logic Analysis US Patent No.: US 8,891,240 B2Apparatus and Method for Cooling A Semiconductor Device US Patent No.: US 8,436,631 B2Wafer Stage US Patent No.: US 8,278,959 B2Method and System for Measuring Laser Induced Phenomena Changes in a Semiconductor Device US Patent No.: US 8,072,699 B2Solid Immersion Lens Optics Assembly US Patent No.: US 7,623,982 B2Method of Testing an Electrical Circuit and Apparatus Thereof US Patent No.: US 7,456,032 B2Method and System for Measuring Laser Induced Phenomena Changes in a Semiconductor Device US Patent No.: US 6,897,664 B1Laser Beam Induced Phenomena Detection
