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OPTICAL FAULT
LOCALIZATION SYSTEM
SEMICAPS PEM
Liquid
Crystal Option
A complimentary technique to PEM. Liquid crystal detects failures
that
emit heat. By integrating LC with PEM, a wider range of failure
modes
can be detected on a single platform |
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CAD Navigation option
Compatible with Knights CAD systems. Provides the ability to match
the localized area of interest on the DUT to the CAD
layout Interface between SEMICAPS and CAD system via RS232
communication or Ethernet communication.
Spectroscopic option
Four ways of implementing spectroscopy
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Using
filter wheels
- Easy to implement
- Max ten filters. Ten points on spectrum, not
continuous.
- Each filters do not have the same band-pass.
- Many steps to get a spectrum.
- Long acquisition time.
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Using
Mirror & Spectrometer
- Difficult to implement
- High collection efficiency (>80%)
- Continuous spectrum and high resolution
- Very short working distance not compatible with deep
encapsulated package devices
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Using
Diffraction Grating
- Almost continuous spectrum
- Ease of acquisition
- See the whole spectrum accumulating at the same time
- Use higher order of diffraction
- Have Zero order spot
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Using Prism
- Almost continuous spectrum
- Ease of acquisition
- See the whole spectrum accumulating at the same time
- Non linear, requires calibration
- No Zero order spot
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Probing
Options: Manual, Automatic, Retrofit
SEMICAPS offers integration with commercially available probe
stations for manual, semi-automatic, probe-card probing
solutions and 200mm/300mm system.
Camera & Laser Scan Module Upgrade
The SEMICAPS PEM is fully upgradable to incorporate camera like
InGaAs (TE-Cooled/LN2), Thermal Emission Camera and
NIR laser scan option with 1064nm or 1340nm source
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Description