Main
applications for the Photon Emission Microscope is to locate
failures like leaky junctions, contact spiking (due to ESD),
latch-up, oxide breakdown, and other current leakage phenomena that
produce light emissions.
Classifications of Emissions
- Emissions that represent a weakness of the junctions
- Oxide leakage
- Latch-up
- Hot electron
- Emissions that are artifacts of design or test conditions
- Forward/reverse biased diodes
- Saturated MOS transistors
- Floating gates
- Emissions that are non detectable
- Buried junctions
- Non emitting leakage sites
- Ohmic shorts
- Shorted metal interconnects
Description