|
2000 |
Best paper award for SCOBIC in International Symposium on Technical Failure Analysis 2000 (ISTFA) |
| 2000 | Improved sensitivity SEMICAPS Photon Emission Microscope System, SPEMS 1150P, was launched at Integrated Reliability Physics Symposium 2000 held in San Jose, CA, USA |
| 2000 | Improved Backside Imaging for the SPEMS 1150P |