Silicon Immersion Lens (SIL)

SEMICAPS has recently developed the Silicon Immersion Lens (SIL) to improve and enhance the resolution and magnification for the laser scanned images from our SOM. The SIL mechanism can be easily adapted to our analytical or inverted SOM and its operation is via motorized and software controlled.
 

New Probe Card Probing Solution

To make probe card probing less hectic and time-consuming, SEMICAPS has developed a new probe station with high-resolution X-Y-Z and theta manipulations. With the aid of a full microscope, landing of probe card onto DUT is made much easier. The new probe station can be mounted on the SOM 3000 and has the option to be lifted off by a lifter when user requires the system for tester docked  applications.

Pulsed Laser Technique without Lock-in

Through continuous development works, SEMICAPS's pulsed laser technique can be achieved without meddling with complicated lock-in  amplifier. The pulsing laser technique is effective in removing periodic noise by device internal clock or capacitive breakdowns, resulting in  better SNR and no tailing effect due to amplifier response.